F-θ flat filed scanning lenses are widely used in laser applications,such as laser marking,engraving and cutting systems.F-θ lenses are capable of creating a flat field at the image plane when working together with laser source,beam expander and galvanometers.We provides F-θ flat field scanning lenses with diffraction limited performance and high damage threshold at the lower price compared to world-famous optics companies.
Fine flat field performance
Custom solution for different laser source
High damage threshold
Parameters:
Wavelength λ(nm) |
Focal length f(mm) |
Scan Field Range |
355 |
100--840 |
70×70--600×600 |
532 |
63 --535 |
35×35—370×370 |
450-540 |
63 –580 |
35×35--400×400 |
808-980 |
63 –580 |
35×35--400×400 |
1064 |
63 –815 |
35×35--565×565 |
1030-1080 fused silica |
63 –860 |
35×35--620×620 |
1550 |
100--170 |
55×55--110×110 |
10.6µm(CO2) |
53 --830 |
30×85--600×600 |
355nm Wavelength
Focal Length (mm) |
Working Distance (mm) |
Scan Field (mm) |
Scan Angle |
Incident Beam Ø[mm] |
Spot Size |
Outside Ø [mm] |
Mount Thread |
100mm |
121.36 |
Φ100 (70×70) |
±25º |
8 |
8.2µm |
90 |
M85×1 |
160mm |
187.39 |
Φ155 (110×110) |
±25º |
10 |
10.2µm |
90 |
M85×1 |
162mm |
200.82 |
Φ158 (112×112) |
±28º |
12 |
8.8µm |
105 |
M85×1 |
170mm (170.01) |
210.19 |
Φ148 (105×105) |
±25º |
10 |
11.1µm |
90 |
M85×1 |
172mm (172.014) |
213.26 |
Φ150 (106×106) |
±25º |
12 |
9.4µm |
105 |
M85×1 |
210mm |
236.41 |
Φ185 (130×130) |
±25º |
15 |
9.1µm |
120 |
M85×1 |
254mm |
318.20 |
Φ220.4 (156×156) |
±25º |
16 |
10.3µm |
120 |
M85×1 |
255mm |
303 |
Φ221 (156×156) |
±25º |
16 |
11.1µm |
∮120 |
M85×1 |
305mm |
365.55 |
Φ285 (201×201) |
±26.7º |
16 |
12.38µm |
∮120×66.7 |
M85×1 |
470mm |
535.59 |
Φ410 (290×290) |
±25º |
16 |
19.08µm |
120 |
M85×1 |
580mm |
664.15 |
Φ509 (360×360) |
±25º |
16 |
25.2µm |
120 |
M85×1 |
750mm |
823.36 |
Φ735 (520×520) |
±28º |
16 |
32.3µm |
120 |
M85×1 |
840mm |
921.44 |
Φ850 (601×601) |
±29º |
16 |
34.1µm |
120 |
M85×1 |
Ante Laser Technology Co.,Ltd